Item type |
学術雑誌論文 / Journal Article(1) |
公開日 |
2008-03-07 |
タイトル |
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タイトル |
Designing Circuits from Imperfect Components in VISI Giga-scale Technologies |
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言語 |
en |
言語 |
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言語 |
eng |
主題 |
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言語 |
en |
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主題Scheme |
Other |
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主題 |
Integrated circuit technology |
主題 |
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言語 |
en |
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主題Scheme |
Other |
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主題 |
manufacturing yield |
主題 |
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言語 |
en |
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主題Scheme |
Other |
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主題 |
redundant design |
主題 |
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言語 |
en |
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主題Scheme |
Other |
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主題 |
quality of electronic components |
資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
アクセス権 |
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アクセス権 |
open access |
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アクセス権URI |
http://purl.org/coar/access_right/c_abf2 |
作成者 |
RuBio, Antonio
Martorell, Ferran
Moll, Francesc
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内容記述 |
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内容記述タイプ |
Abstract |
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内容記述 |
The evolution of the integrated circuit technology during the last 3 decades has been based on an increasing accuracy of the manufacturing process. With thisprinciple and by using a quality control at the end of the production line (Test Technology) the semiconductor industry has reached very high productivity levels. However, with technology reaching criticalsizes ( < 65 nm) the manufacturing controlis startingto failand new design principles have to be introduced to be able to produce functional chips from low quality components. In this article two scenarios partially addressing the problem with gradual introduction of redundancy are considered: the scenario of the era at the end of the CMOS Moore's Law and the expected next scenario of nanoelectronic technology using new emergent devices. In the paper techniques for the design of robust electronic systems in spite of the low quality of components are presented for the two scenarios. |
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言語 |
en |
出版タイプ |
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出版タイプ |
VoR |
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出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
書誌情報 |
en : International Journal of the Society of Materials Engineering for Resources
巻 14,
号 1/2,
p. 1-6,
発行日 2006-11-01
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収録物識別子 |
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収録物識別子タイプ |
PISSN |
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収録物識別子 |
1347-9725 |
収録物識別子 |
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収録物識別子タイプ |
NCID |
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収録物識別子 |
AA1095475X |
出版者 |
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出版者 |
The Society of Materials Engineering for Resources of Japan |
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言語 |
en |
関連情報 |
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関連タイプ |
isIdenticalTo |
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識別子タイプ |
DOI |
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関連識別子 |
http://doi.org/10.5188/ijsmer.14.1 |