{"created":"2023-07-25T10:21:43.172535+00:00","id":830,"links":{},"metadata":{"_buckets":{"deposit":"70373d76-fb45-412f-be3a-9d1947ea8a6f"},"_deposit":{"created_by":3,"id":"830","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"830"},"status":"published"},"_oai":{"id":"oai:air.repo.nii.ac.jp:00000830","sets":["590:664:665:668"]},"author_link":["2864","2863"],"item_10001_alternative_title_1":{"attribute_name":"別タイトル","attribute_value_mlt":[{"subitem_alternative_title":"Use of Auger Parameter in the Characterization of Chemical State by X-ray Photoelectron Spectroscopy : A Review"}]},"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-03-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1/2","bibliographicPageEnd":"9","bibliographicPageStart":"1","bibliographicVolumeNumber":"18","bibliographic_titles":[{"bibliographic_title":"素材物性学雑誌"}]}]},"item_10001_description_5":{"attribute_name":"内容記述（抄録）","attribute_value_mlt":[{"subitem_description":"In this review the concept of Auger parameter and its applications for the XPS analysis of materials and their surfaces are described. First, the definition of the Auger parameter and the experimental methods to obtain the Auger parameter are introduced. Then the physical meaning of the Auger parameter is clarified and the relations between the bulk properties of materials, such as polarizability, refractive index, and band-gap, and the Auger parameter is interpreted. The recent applications of Auger parameter for the analysis of materials and their surfaces, such as alloys, thin films, surface layers, clusters, catalysis, and surface corrosion, are reviewed.","subitem_description_type":"Other"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本素材物性学会"}]},"item_10001_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AN10140273","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09199853","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"文珠四郎, 秀昭"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Monjushiro, Hideaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-16"}],"displaytype":"detail","filename":"sozai18a.pdf","filesize":[{"value":"1.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"sozai18a.pdf","url":"https://air.repo.nii.ac.jp/record/830/files/sozai18a.pdf"},"version_id":"98adcda4-14d2-4dc2-8230-947c05e13d1b"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"X－ray　Photoelectron　Spectroscopy","subitem_subject_scheme":"Other"},{"subitem_subject":"Auger　Process","subitem_subject_scheme":"Other"},{"subitem_subject":"Auger　Parameter","subitem_subject_scheme":"Other"},{"subitem_subject":"Surface　Analysis","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"XPS分析におけるオージェパラメーターの活用","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"XPS分析におけるオージェパラメーターの活用"}]},"item_type_id":"10001","owner":"3","path":["668"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-03-06"},"publish_date":"2008-03-06","publish_status":"0","recid":"830","relation_version_is_last":true,"title":["XPS分析におけるオージェパラメーターの活用"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-25T12:00:50.346565+00:00"}